섹션 설정
GaN Product
Dimension | ⌀ 100 ± 0.1 mm | |||
Thickness | 4.5 ± 0.5 ㎛, 20 ± 2 ㎛ | |||
Usable Surface Area | > 90% | |||
Orientation | C-Plane (0001) ± 0.5º | |||
Conduction Type | N-type (Undoped) | N-type (Si-doped) | ||
Resistivity (300K) | < 0.5 Ω·cm | < 0.05 Ω·cm | ||
Carrier Concentration | < 5 x 10¹⁷ cmˉ³ | > 1 x 10¹⁸ cmˉ³ | ||
Mobility | ~ 300 cm² /V·s | ~ 200 cm² /V·s | ||
Dislocation Density | Less than 5 x 10⁸ cmˉ² (estimated by FWHMs of XRD) | |||
Substrate Structure | GaN on sapphire (standard: SSP / option: DSP) | |||
Package | Packaged in a class 100 clean room environment, in cassette of 25pcs or single container, under a nitrogen atmosphere |